Project description
At the Fraunhofer Institute for Production Technology IPT in Aachen, we are creating the production of the future with more than 450 employees – digital, sustainable and resilient. In the department »Production Metrology«, we deal with optical metrology systems in the context of production metrology. This includes modification and sensor fusion based on commercial sensing equipment, development of new metrology systems and integration into production facilities. Within the scope of your thesis, you will investigate the possibility to capture a light ray’s wavefront in high resolution utilizing an adaptive sensor concept. The wavefront serves as an indicator for beam quality in an optical set-up and consecutively for the assessment of involved optical components and their alignment. The investigation includes aspects of theoretical and simulation-based design, as well as experimental testing of the sensor in a lab set-up. Depending on your expertise and areas of interest, this work’s focus can be set on a part of these topics or separated in several theses. In an advanced set-up the sensor can be used for precise surface geometry measurement. The job requires regular attendance at our institute in Aachen. Be part of change Support conceptualization and component selection Design of experimental set-up Set-up, alignment and calibration of the sensor Conducting test measurements Theoretical and experimental investigation of postprocessing and interpretation methods System integration into an automated production environment
Funding and compensation
Compensation not specified. See the original posting for amounts, duration and conditions.
Eligibility and application requirements
Review the qualifications, research interests and required documents in the description above. The employer or university's original posting is the source for complete eligibility requirements.
How to apply
Submit your application through Fraunhofer's official application process. Apply early as a closing date has not been specified.
Source and listing information
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